High speed surface profilometry based on an adaptive microscope with axial chromatic encoding Book [PDF] Download

Download the fantastic book titled High speed surface profilometry based on an adaptive microscope with axial chromatic encoding written by Luo, Ding, available in its entirety in both PDF and EPUB formats for online reading. This page includes a concise summary, a preview of the book cover, and detailed information about "High speed surface profilometry based on an adaptive microscope with axial chromatic encoding", which was released on 25 February 2021. We suggest perusing the summary before initiating your download. This book is a top selection for enthusiasts of the Computers genre.

Summary of High speed surface profilometry based on an adaptive microscope with axial chromatic encoding by Luo, Ding PDF

An adaptive microscope with axial chromatic encoding is designed and developed, namely the AdaScope. With the ability to confocally address any locations within the measurement volume, the AdaScope provides the hardware foundation for a cascade measurement strategy to be developed, dramatically accelerating the speed of 3D confocal microscopy.


Detail About High speed surface profilometry based on an adaptive microscope with axial chromatic encoding PDF

  • Author : Luo, Ding
  • Publisher : KIT Scientific Publishing
  • Genre : Computers
  • Total Pages : 202 pages
  • ISBN : 3731510618
  • PDF File Size : 49,6 Mb
  • Language : English
  • Rating : 4/5 from 21 reviews

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  • Publisher : Unknown Publisher
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Optical coherence tomography (OCT) is a promising non-invasive non-contact 3D imaging technique that can be used to evaluate and inspect material surfaces, multilayer polymer films, fiber coils, and coatings. OCT

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This second edition provides a cutting-edge overview of physical, technical and scientific aspects related to the widely used analytical method of confocal Raman microscopy. The book includes expanded background information

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This book systematically describes the most widely used techniques for the microanalysis of the physical, structural, and compositional properties of solids. Covering electron beams, ion beams, photon beams, and acoustic

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Until comparatively recently, trace analysis techniques were in general directed toward the determination of impurities in bulk materials. Methods were developed for very high relative sensitivity, and the values determined