Download the fantastic book titled Diagnostic Measurements in LSI VLSI Integrated Circuits Production written by Andrzej Jakubowski, available in its entirety in both PDF and EPUB formats for online reading. This page includes a concise summary, a preview of the book cover, and detailed information about "Diagnostic Measurements in LSI VLSI Integrated Circuits Production", which was released on 20 May 1991. We suggest perusing the summary before initiating your download. This book is a top selection for enthusiasts of the Technology & Engineering genre.
Summary of Diagnostic Measurements in LSI VLSI Integrated Circuits Production by Andrzej Jakubowski PDF
This book describes means in improving the technology of LSI/VLSI ICs production. It does so by concentrating on improvements of manufacturing yield and quality of the products by detecting weak points which should be eliminated on the way up the learning curve. The book presents a systematic approach to the problem, covering primarily methods based on the use of test patterns measurements, in both mass production and in research and development activities. The main groups of defects found in IC chips and ways to detect them using test structures are discussed in detail.
Detail About Diagnostic Measurements in LSI VLSI Integrated Circuits Production PDF
- Author : Andrzej Jakubowski
- Publisher : World Scientific
- Genre : Technology & Engineering
- Total Pages : 382 pages
- ISBN : 9789810202828
- Release Date : 20 May 1991
- PDF File Size : 12,9 Mb
- Language : English
- Rating : 4/5 from 21 reviews
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